shanghai kerang technology co ltd
Shanghai kerang technology co ltd
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Test Sphere Probe HT-I01
Standard:IEC61032 fig.1, IEC60529 IP1 and IEC60065.
Application:This probe is intended to verify protection the back of hand of persons against access to hazardous parts.
It is also the necessary probe used to prevent the hazardous parts and solid foreign objects from entering.
Test sample:Easily accessible enclosure live parts or mechanical parts.
Feature:This test probe can be customized. It can be used for anti-electric shock test when equipped with amphenol connector.
Or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer) .
The probe whose model number is with "T" is with force.
Parameters:
| Model | HT-I01 | HT-I01T |
| Name |
Test probe A |
Test probe A with force |
| Rigid test ball diameter (metal) | SФ50+0.05 0 | SФ50+0.05 0 |
| Baffle diameter (nylon) | Ф45±0.2 | Ф45±0.2 |
| Baffle thickness | 4 | 4 |
| Handle diameter | Ф10 | Ф10 |
| Handle length (nylon) | 100 | 100 |
| Force | ---- | With force of 0-50N |